Morphologic Analysis
The scanning electron microscope (SEM, ZEISS-EVO MA10) is a type of electron microscope that obtains images by scanning the sample surface with a focused beam of electrons.
Energy dispersive X-ray spectroscopy (EDX) analysis is used to obtain the elemental composition of a sample and provides a more quantitative result than can be achieved with SEM analysis alone. The combination of SEM and EDX analysis offers chemical composition and fundamental research and provides a comprehensive metallurgical assessment.
Electrons interact with atoms in the sample to produce different signals that contain information about the topography and composition of the sample surface. The secondary electrons emitted by the sample’s atoms excited by the electron beam are mostly used to create images in SEM.
With SEM, any non-liquid conductive or non-conductive sample such as plastic polymers, fibers, particles (such as sand, gravel, pollen), metals, and textiles can be examined. Non-conductive samples can be made to be examined by coating them with very thin conductive material.
As MecNano Technologies, we analyse the morphology and elemental composition of your products with our Science Team and present them as a scientific report.
